VeeMAX II

VeeMAX II – the ultimate specular reflection

• selectable angle of incidence – from 30 to 80 degrees in one degree increments
• measurement of thin films and monolayers to relatively thick films
• optimize specular reflectance results with selectable angle of incidence
• integrated position for IR polarization (KRS-5 for mid-IR and polyethylene for far-IR) - essential for monolayer analysis and study of sample orientation
• available sample masks: 2”, 5/8” and 3/8”

VeeMAX II with ATR – Variable Angle, Single Reflection ATR for Depth Profiling Studies

• continuously variable set angle of incidence – 30 to 80 degrees
• 0.4 to 46 micron depth of penetration – dependent on crystal material, angle of incidence, sample’s refractive index and wavelength of IR beam – ideal for depth profiling studies
• high throughput for excellent quality spectra in a short time period
• optional, high-pressure clamp for sampling of films, coatings or powdered samples
• liquid samples can be analyzed with optional liquid retainer
• flow-through attachment for continuous monitoring or handling samples that pose a hazard from ambient exposure